True Sample Topography Acquired by Low-Noise Z Position Sensor Ahram Kim (Research Product Management of Park Systems, Seoul, Korea)   Piezoelectric material has been widely used as the a...

SrTiO3 Surfaces by Using Park Systems XE-70 AFM SrTiO3 Surfaces by Using Park Systems XE-70 Atomic Force Microscope John G. Connell and S. S. Ambrose SeoDepartment of Physics and Astronomy...

Nanoscale Surface Photovoltage Spectroscopy Investigation of Nanostructures Utilizing the XE-series Instruments Case Study: Zinc Oxide Nanostructures BY T.A. Merz, D.R. Doutt, and L.J. Brillso...

Cross-section of Polymer Film Imaging a Narrow Area Using an XE-100 AFM Instrument Case study: Cross-section of a Polymer Film  By H.-Y. NieThe University of Western Ontario The sur...

Zinc Oxide Surfaces Nanoscale AFM and KPFM Mapping of Localized Charge and Recombination Centers on Chemically Active ZnO Surfaces Case Study: Zinc Oxide Surfaces   General Consideration...

AlGaN/GaN HEMT Reliability XE-seriesinstruments create new ways to understand GaN HEMT reliability issues Case Study: AlGaN/GaN HEMT reliabilityBy Chung-Han Lin, D. R. Doutt, and L. J. Bri...

Solar Cells Optical Property - Photoconductivity   Topography (left image) and photocurrent (right images) with laser source on (top right image) and laser source off (bot...

Patterned Arrays of Magnetic Nanostructure Patterned arrays of magnetic nanostructures have become one of the key issues in recent years because of its potential application to information techn...

Atomic Force Microscopy and Raman Spectroscopy (AFM/Raman)   1. The basic parameters of the AFM head are defined with the Park Systems software   2. The Labspec softw...

Quantum Dots/Photonic Devices Optical Properties – SERS/NSOM/Topography       Gold nanoparticles are imaged with high resolution.  Gold nanoparticles are known to promo...