Park Systems has become an official sponsor to IEEE Conference, solely endeavoring for the development of nanotechnology. Join Park Systems along with Techcomp to learn more about the latest atomic force microscopy (AFM) technologies at Park.

Date / Time

Exhibition

Sang-il Park’s Presentation

Aug 5 ~ 8, 2013

Aug 7, 11am, 2013

Venue

Shangri-La Hotel, Beijing

Booth #

# 1

Presentation

Dr. Sang-il Park, founder and CEO of Park Systems, is invited as akeynote speaker to The 13^th IEEE International Conference on Nanotechnology. His presentation, entitled "Evolution of atomic force microscopy: from a tool for nano-science to the vehicle for nano-industry ", will cover the history and characteristics of AFM, and various types of AFM developed by Park Systems.This includes AFM’s pros and cons, advancement from piezo-tube scanner, AFM’s evolution to an ideal methodology for non-destructive sample scan with longer tip life, and new AFM platform enabling capability to capture images in 3D and scanning ion conductance microscopy (SICM) for single live cell imaging.

About IEEE International Conference

The IEEE International Conference on Nanotechnology aims to bring together researchers, industry workers, entrepreneurs and funding agency leaders, in the general area of nanotechnology. IEEE NANO 2013 will provide a forum for the exchange of ideas, interaction, networking and collaboration for research and development in nanotechnology with special attention to the latest advances in the field.

Source

http://ieeenano2013.org/