ナノテクノロジーにおける新たなトレンド

Applications

AFMに関する最近の動向を把握できるパーク・システムズの技術記事をご紹介

Online NanoAcademy

AFMの専門家によるウェビナーやライブデモ、教育用ビデオなどの情報はこちらから

Scholarship

若手研究者の研究成果を共有・議論できるよう奨励することで、ナノサイエンスの次世代パイオニアを支援する奨学金プログラム

Q2 2013

EVENTS

Semicon West 2013
July 9th ~ 11th
San Francisco, USA

JASIS
September 4th ~ 6th
Tokyo, Japan

ACS Fall 2013
September 8th ~ 12th
Indianapolis, USA

LATEST NEWS

Park Q2 Webinar

M&A Cover Story

Interview:
with Prof.Hae-sung Lee

Interview:
with Enterprise Network

The Most Accurate Atomic Force Microscope
	Featured Application: Automatic Defect Review

	Automatic Defect Review (ADR) speeds up and improves the way defects in substrates and media are identified, scanned, and analyzed. Using the defect location map provided from an optical inspection tool, Park ADR automatically goes to the defect location and images the defects in two steps: (1) a larger, survey scan image to refine the location and (2) then a smaller, zoom-in scan image to obtain the details of the defect. Test runs with real defects demonstrate a 10x increase in throughput for defect review in an automated process when compared with more traditional methods of defect review. READ MORE

Featured Product: Park NX20
	Park NX20, the leading nanometrology tool for failure analysis and large sample research, is equipped with unique features that make it easier to uncover the reasons behind device failure and develop more creative solutions. Its unparalleled precision provides high resolution data that lets you focus on your work, while its True Non-Contact Mode™ scan keeps tips sharper and longer, so you won’t have to waste as much time and money replacing them. READ MORE
Park Research Interview Series: Prof. Hae-sung Lee
	Prof. Lee: As my research field is related to chemistry, I usually use AFM to evaluate the nano-structure and characteristics of materials. For the last 20 years, I have been using 4-5 different kinds of AFMs to do experiments, and since I joined the University of Junju in 2007, I have been using versatile Park Systems equipment for my teams’ experiments. READ MORE

Park LIVE
AFM Webinar
June 26-27

Part 1

Park NX10
The Quickest Path to Innovative Research

Park NX20
The Leading Nano Metrology Tool for Failure Analysis and Large Sample Research

Part 2

Park SICM
Single Live Cell Imaging With Park Scanning Ion Conductance Microscopy (SICM)

Register NOW

For further inquiries please contact us via inquiry@parkafm.com
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