Probe Store - SCM
* We do not guarantee the performance of probes ordered directly from the manufacturer; for optimal performance with our AFM systems please request a quote from Park Systems.
| Probe | Force Constant (N/m) | Frequency (kHz ) | Manufacture | Short Description | Quote | ||||||||||||||||||
| PPP-EFM | 2.8 | 75 | Nanosensors | ▪ Cantilever with lower force constant, REQUIRES Ceramic chip carrier ▪ Conductive tip for electric application, Coated with Pt-Ir |
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The new PointProbe® Plus (PPP) combines the well-known features of the proven PointProbe® series such as high application versatility and compatibility with most commercial SPMs with a more reproducible tip radius as well as a more defined tip shape. The minimized variation in tip shape provides more reproducible images. The PPP-EFM probe is offered for electrostatic force microscopy. An overall metallic coating (PtIr5) on both sides of the cantilever increasing the electrical conductivity of the tip. The force constant of this type is specially tailored for the electrostatic force microscopy yielding very high force sensitivity while simultaneously enabling tapping mode and lift mode operation.
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| Platinum | 18 | 14 | - | ▪ Contact cantilever made of solid platinum ▪ Recommended for high voltage/current application above ±10 V or 1 µA |
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The solid platinum probe, whose tip radius is smaller than 20nm, shows better performance than a typical metal-coated probes.
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