Electrical and Other Sample Characterization Modes
Standard Imaging
• True Non-Contact AFM
• Basic Contact AFM
• Lateral Force Microscopy (LFM)
• Phase Imaging
• Intermittent (tapping) AFM
Chemical Properties
• Chemical Force Microscopy
• Electrochemical Microscopy(EC-STM and EC-AFM)
Force Measurement
• Force Distance (F-D) Spectroscopy • Force Volume Imaging • Spring Constant Calibration by Thermal Method
Electrical Properties
• Conductive AFM
• I-V Spectroscopy
• Scanning Kelvin Probe Microscopy (SKPM/KPM)
• SKPM with High Voltage
• Scanning Capacitance Microscopy (SCM)
• Scanning Spreading-Resistance Microscopy (SSRM)
• Scanning Tunneling Microscopy (STM)
• Scanning Tunneling Spectroscopy (STS)
• Time-Resolved Photo Current Mapping (Tr-PCM)
Magnetic Properties
• Magnetic Force Microscopy (MFM)
• Tunable MFM
Optical Properties
• Tip-Enhanced Raman Spectroscopy (TERS)
• Time-Resolved Photo Current Mapping (Tr-PCM)
Dielectric/Piezoelectric Properties
• Electric Force Microscopy (EFM)
• Dynamic Contact EFM (DC-EFM)
• Piezoelectric Force Microscopy (PFM)
• PFM with High Voltage
Mechanical Properties
• Force Modulation Microscopy (FMM)
• Nanoindentation • Nanolithography
• Nanolithography with High Voltage
• Nanomanipulation • Piezoelectric Force Microscopy (PFM)
Thermal Properties
Adaptable to any project
With a wide range of scanning modes and modular design, the Park NX20 has the power and flexibility you need for any project.
Surface Roughness Measurement
• True Non-Contact Mode
• Dynamic Force Mode
Electrical Characterization
• Conductive AFM (ULCA and VECA)
• Electric Force Microscopy (EFM)
• Piezoelectric Force Microscopy (PFM)
• Scanning Capacitance Microscopy (SCM)
• Scanning Kelvin Probe Microscopy (SKPM)
• Scanning Spreading Resistance Microscopy (SSRM)
• Scanning Tunneling Microscopy (STM)
• Time-Resolved Photo Current Mapping (Tr-PCM)
Mechanical Characterization
• Force Modulation Microscopy (FMM)
• Force-Distance (F-d) Spectroscopy
• Force Volume Imaging
• Lateral Force Microscopy (LFM)
• Nanoindentation
• Nanolithography
• Phase Imaging
Electrical and Other Sample Characterization Modes
QuickStep SCM
The Fastest Scanning Capacitance Microscopy
PinPoint iAFM
The Frictionless Conductive AFM
Magnetic Force Microscopy (MFM)
Accurately view your sample’s magnetic structure
Scanning Thermal Microscopy (SThM)
Easily examine your sample’s thermal conductivity.
