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  • NX10-AFM
    革新的研究への近道に Park NX10
  • SmartScan-AFM
    簡単&パワフルシンプルな3ステップの操作 Park SmartScan
  • NX20-AFM
    故障解析や大型サンプルを用いた研究に最高の一択 Park NX20
  • NX-wafer-AFM
    自動欠陥レビュー機能を備えた唯一のウエハファブAFM Park NX-Wafer
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Electrical and Other Sample Characterization Modes

  

Adaptable to any project

With a wide range of scanning modes and modular design, the Park NX20 has the power and flexibility you need for any project.

Surface Roughness Measurement

 • True Non-Contact Mode

 • Dynamic Force Mode

Electrical Characterization

 • Conductive AFM (ULCA and VECA)

 • Electric Force Microscopy (EFM)

 • Piezoelectric Force Microscopy (PFM)

 • Scanning Capacitance Microscopy (SCM)

 • Scanning Kelvin Probe Microscopy (SKPM)

 • Scanning Spreading Resistance Microscopy (SSRM)

 • Scanning Tunneling Microscopy (STM)

 • Time-Resolved Photo Current Mapping (Tr-PCM)

Mechanical Characterization

 • Force Modulation Microscopy (FMM)

 • Force-Distance (F-d) Spectroscopy

 • Force Volume Imaging

 • Lateral Force Microscopy (LFM)

 • Nanoindentation

 • Nanolithography

 • Phase Imaging

Electrical and Other Sample Characterization Modes

QuickStep SCM

The Fastest Scanning Capacitance Microscopy

PinPoint iAFM

The Frictionless Conductive AFM

Magnetic Force Microscopy (MFM)

Accurately view your sample’s magnetic structure

Scanning Thermal Microscopy (SThM)

Easily examine your sample’s thermal conductivity.

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  November 11 - November 13 , 2020
  September 29 - September 29 , 2020
 

Atomic Force Microscopy | AFM Microscope | Park Systems