Adaptable to any project

With a wide range of scanning modes and modular design, the Park NX20 has the power and flexibility you need for any project.

Surface Roughness Measurement

 • True Non-Contact Mode

 • Dynamic Force Mode

Electrical Characterization

 • Conductive AFM (ULCA and VECA)

 • Electric Force Microscopy (EFM)

 • Piezoelectric Force Microscopy (PFM)

 • Scanning Capacitance Microscopy (SCM)

 • Scanning Kelvin Probe Microscopy (SKPM)

 • Scanning Spreading Resistance Microscopy (SSRM)

 • Scanning Tunneling Microscopy (STM)

 • Time-Resolved Photo Current Mapping (Tr-PCM)

Mechanical Characterization

 • Force Modulation Microscopy (FMM)

 • Force-Distance (F-d) Spectroscopy

 • Force Volume Imaging

 • Lateral Force Microscopy (LFM)

 • Nanoindentation

 • Nanolithography

 • Phase Imaging

Electrical and Other Sample Characterization Modes

QuickStep SCM

The Fastest Scanning Capacitance Microscopy

PinPoint iAFM

The Frictionless Conductive AFM

Magnetic Force Microscopy (MFM)

Accurately view your sample’s magnetic structure

Scanning Thermal Microscopy (SThM)

Easily examine your sample’s thermal conductivity.