|お問い合わせ|
  • NX10-AFM
    革新的研究に最短の道程 Park NX10
  • SmartScan-AFM
    簡単&パワフルシンプルな3ステップの操作 Park SmartScan
  • NX20-AFM
    不良解析や大型試料を用いた研究に付加価値の高い選択肢l Park NX20
  • NX-wafer-AFM
    インラインのウエハ検査とメトロロジーの為の全自動AFM Park NX-Wafer
our clients

Learn how AFM works

  • All
  • AFM-Principle
  • Non-Contact Mode
  • Contact AFM Mode
  • EFM Modes
All categories
  • All
  • AFM-Principle
  • Non-Contact Mode
  • Contact AFM Mode
  • EFM Modes
Nano World AFM-Principle
Nano World, AFM Principle
Non-Contact Mode Non-Contact Mode
Non-Contact Mode
Contact AFM Mode Contact AFM Mode
Contact AFM Mode
EFM Modes EFM Modes
Electric Force Microscopy (EFM)

Atomic Force Microscopy | AFM Microscope | Park Systems