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    革新的研究への近道に Park NX10
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    簡単&パワフルシンプルな3ステップの操作 Park SmartScan
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    故障解析や大型サンプルを用いた研究に最高の一択 Park NX20
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    自動欠陥レビュー機能を備えた唯一のウエハファブAFM Park NX-Wafer
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Park Systems’ XE-series will be displayed at the followingexhibitions; we will be delighted to see you there!      
 
 
 
ICN+T 2008, July 21-24 in Keystone, Colorado USA 
Diskcon Japan 2008, July 22-23 in Tokyo, Japan
ACS Fall 2008, August 17-21 in Philadelphia, Pennsylvania
IMRC 2008, August 17-21 in Cancun, Mexico
Nano Korea 2008, August 27-29 in Ilsan, Korea
 

Preview available for XE-Bio, a New Bio-AFM for Nano-Bio Science from Park Systems

The XE-Bio is an innovative yet user-friendly Atomic Force Microscope (AFM) designed specifically to meet the needs of life science and biomedical researchers. The remarkable modular design of the XE-Bio provides the user with a wide array of imaging modes including the revolutionary Scanning Ion Conductance Microscopy (SICM). For further information on the XE-Bio or discussion on the opportunity to participate in our beta-testing program, please email//www.parkafm.com/news/このメールアドレスはスパムボットから保護されています。閲覧するにはJavaScriptを有効にする必要があります。 " style="color:rgb(102, 102, 102);text-decoration:none">このメールアドレスはスパムボットから保護されています。閲覧するにはJavaScriptを有効にする必要があります。

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ICN+T 2008: Park Systems Company Symposium, July 22nd 

 
 
 
Park Systems will be holding a company symposium this July at the ICN+T 2008 in Keystone, Colorado. This symposium will offer a “sneak preview” on the new innovative products of the XE-Bio for nano-bio science and cell dynamics, the XE-3DM for undercut characterization and sidewall metrology as well as more detailed presentation on other XE-series. The event is an excellent opportunity to hear about the latest technology from Park Systems. For more information or to sign up for the symposium, contact Agatha Yun. Participants will be provided with an evening snack and a USB drive.
 
Dr Sang-il Park, Park Systems’ CEO will be presenting an invited talk on Dimensional Nanometrology with Atomic Force Microscopy during the conference in the morning of July 22nd
 
 

"Probing the Nanoscale" Workshop at the Stanford-IBM Center

On May 23rd, Park Systems’ CEO Dr. Sang-il Park gave an invited talk at the annual ‘Probing the Nanoscale’ workshop at the Standford-IBM Center. His speech, entitled Probing the Nanoscale with Advanced AFM/SPM discussed the precision nanometrology of a new AFM platform with decoupled, flexure based XY and Z-scanners compared with conventional AFM systems based on piezoelectric tube scanners. The workshop was well attended by over 180 participants including Prof. Calvin Quate, Dr Harald Hess and other major players in the field of nanoscience and engineering.
 

IMAGES BY XE-AFM

Click here for a view of AFM images taken by Park Systems XE-series.

Stay tuned for our next issue with a more in-depth guide on what our AFM can do for you in specific applications.

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  November 11 - November 13 , 2020
  September 29 - September 29 , 2020
 

Atomic Force Microscopy | AFM Microscope | Park Systems