|お問い合わせ|
  • NX10-AFM
    革新的研究への近道に Park NX10
  • SmartScan-AFM
    簡単&パワフルシンプルな3ステップの操作 Park SmartScan
  • NX20-AFM
    故障解析や大型サンプルを用いた研究に最高の一択 Park NX20
  • NX-wafer-AFM
    自動欠陥レビュー機能を備えた唯一のウエハファブAFM Park NX-Wafer
our clients
   

  Q2 2013

  park logo  
 park newsletter tweeterfacebookblog
 
 
 EVENTS

Semicon West 2013
July 9th ~ 11th
San Francisco, USA

JASIS
September 4th ~ 6th 
Tokyo, Japan

ACS Fall 2013
September 8th ~ 12th 
Indianapolis, USA

 LATEST NEWS

Park Q2 Webinar 

M&A Cover Story

Interview: 
with Prof.Hae-sung Lee
 

Interview: 
with Enterprise Network

The Most Accurate Atomic Force Microscope 
   Featured Application: Automatic Defect Review
201306 q2

Automatic Defect Review (ADR) speeds up and improves the way defects in substrates and media are identified, scanned, and analyzed. 

Using the defect location map provided from an optical inspection tool, Park ADR automatically goes to the defect location and images the defects in two steps: (1) a larger, survey scan image to refine the location and (2) then a smaller, zoom-in scan image to obtain the details of the defect. Test runs with real defects demonstrate a 10x increase in throughput for defect review in an automated process when compared with more traditional methods of defect review. READ MORE

 
icon Featured Product: Park NX20
201306 q2P s1

Park NX20, the leading nanometrology tool for failure analysis and large sample research, is equipped with unique features that make it easier to uncover the reasons behind device failure and develop more creative solutions. Its unparalleled precision provides high resolution data that lets you focus on your work, while its True Non-Contact Mode™ scan keeps tips sharper and longer, so you won’t have to waste as much time and money replacing them. READ MORE

icon Park Research Interview Series: Prof. Hae-sung Lee
201306 q2P s2

Prof. Lee: As my research field is related to chemistry, I usually use AFM to evaluate the nano-structure and characteristics of materials. 
For the last 20 years, I have been using 4-5 different kinds of AFMs to do experiments, and since I joined the University of Junju in 2007, I have been using versatile Park Systems equipment for my teams’ experiments. 
READ MORE

 
Park LIVE 
AFM Webinar
 
June 26-27
Part 1

Park NX10
The Quickest Path to Innovative Research

Park NX20
The Leading Nano Metrology Tool for Failure Analysis and Large Sample Research
Part 2

Park SICM
Single Live Cell Imaging With Park Scanning Ion Conductance Microscopy (SICM) 
 
Register NOW 
For further inquiries please contact us via このメールアドレスはスパムボットから保護されています。閲覧するにはJavaScriptを有効にする必要があります。
Park Systems Corp. All Rights Reserved.
www.parkAFM.com
   
 

イベント

  November 11 - November 13 , 2020
  September 29 - September 29 , 2020
 

Atomic Force Microscopy | AFM Microscope | Park Systems