革新的研究への近道に Park NX10
簡単＆パワフルシンプルな３ステップの操作 Park SmartScan
故障解析や大型サンプルを用いた研究に最高の一択 Park NX20
自動欠陥レビュー機能を備えた唯一のウエハファブAFM Park NX-Wafer

our clients

Q2 2013

EVENTS

Semicon West 2013
July 9th ~ 11th
San Francisco, USA

JASIS
September 4th ~ 6th
Tokyo, Japan

ACS Fall 2013
September 8th ~ 12th
Indianapolis, USA

LATEST NEWS

Park Q2 Webinar

M&A Cover Story

Interview:
with Prof.Hae-sung Lee

Interview:
with Enterprise Network

The Most Accurate Atomic Force Microscope
	Featured Application: Automatic Defect Review

	Automatic Defect Review (ADR) speeds up and improves the way defects in substrates and media are identified, scanned, and analyzed. Using the defect location map provided from an optical inspection tool, Park ADR automatically goes to the defect location and images the defects in two steps: (1) a larger, survey scan image to refine the location and (2) then a smaller, zoom-in scan image to obtain the details of the defect. Test runs with real defects demonstrate a 10x increase in throughput for defect review in an automated process when compared with more traditional methods of defect review. READ MORE

Featured Product: Park NX20
	Park NX20, the leading nanometrology tool for failure analysis and large sample research, is equipped with unique features that make it easier to uncover the reasons behind device failure and develop more creative solutions. Its unparalleled precision provides high resolution data that lets you focus on your work, while its True Non-Contact Mode™ scan keeps tips sharper and longer, so you won’t have to waste as much time and money replacing them. READ MORE
Park Research Interview Series: Prof. Hae-sung Lee
	Prof. Lee: As my research field is related to chemistry, I usually use AFM to evaluate the nano-structure and characteristics of materials. For the last 20 years, I have been using 4-5 different kinds of AFMs to do experiments, and since I joined the University of Junju in 2007, I have been using versatile Park Systems equipment for my teams’ experiments. READ MORE

Park LIVE
AFM Webinar
June 26-27

Part 1

Park NX10
The Quickest Path to Innovative Research

Park NX20
The Leading Nano Metrology Tool for Failure Analysis and Large Sample Research

Part 2

Park SICM
Single Live Cell Imaging With Park Scanning Ion Conductance Microscopy (SICM)

Register NOW

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PinPoint your Breakthrough via AFM - Webinar Series February - April 2021

May 20 - May 20 , 2021

Sideband Kelvin Probe Force Microscopy for Advanced Materials Characterization

April 22 - April 22 , 2021

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April 23 - April 23 , 2021

パーク・システムズ#8 研究⽤AFM: 原子間力顕微鏡とは- AFM基礎コース Part 2

May 26 - May 28 , 2021

第70回高分子学会年次大会産学コミュニケーションセッション＜オンライン展示会＞...

Atomic Force Microscopy | AFM Microscope | Park Systems

研究用			生産ライン用

Q2 2013

最新ニュース

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Atomic Force Microscopy | AFM Microscope | Park Systems