Undercut Structures and Sidewall Roughness XE-3DM The XE-3DM metrology AFM incorporates the decoupled scanner configuration.   Because the Z scanner is independent of the XY scanner, ...

AFM Metrology Considerations of Hard Disk Manufacturing Why Atomic Force Microscope? As the design rule becomes smaller, traditional metrology tools, such as stylus and optical profilers, and C...

Programmable Data Density (PDD) for High Throughput Feature Measurement Park Systems, the Nanotechnology Solutions Partner for HDD Industry Park Systems serves the hard disk d...

Automatic Defect Review AFM for Hard Disk Media and Substrates Park Systems, Nanotechnology Solutions Partner for HDD Industry Park Systems serves the hard disk drive (HDD) in...

Patterned Arrays of Magnetic Nanostructures Patterned arrays of magnetic nanostructures have become one of the key issues in recent years because of its potential application to information tech...