Park Systems, the AFM technology pioneer and preferred research & industrial nanotechnology solutions partner, invites you to visit us at SEMICON West (Booth #2131), July 9th - 11th, 2013, at the Moscone Center in San Francisco, CA, USA. In the SEMICON West, Park is proud to announce the launch of Park NX-HDM, an automatic defect review AFM and Park's first industrial AFM to be upgraded from XE to NX platform. Please come and discover Parks' fully automated AFM solutions for automatic defect review and sub-angstrom surface roughness for hard disk media.Luncheon Reception
Please join us for a free luncheon reception event with Park Systems at the Fifth Floor Restaurant and Lounge by Hotel Palomar which is located 4~7 minutes away on foot from the Moscone Center. Lunch and drinks will be served from 11:30am to 2:30pm. For more details, please visit the link below.
About Park NX-HDM
The new Park NX-HDM is an automatic defect review AFM that speeds up and improves the way defects in substrates and media are identified, scanned, and analyzed. Park NX-HDM significantly increases throughput for the defect review process with direct linkage to a wide range of optical inspection tools. In addition, True Non-Contact ModeTM, combined with the industry lowest noise floor, provides accurate and reliable measurements for the sub-Angstrom surface roughness of diverse media and substrates.
