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Accurate nanoelectronic investigations of functional materials for optoelectronics application (via PinPoint C-AFM)

 

Thursday, 8 April, 2021

  • 10:00 am – 11:30 am
    (GMT)
    London, Dublin
  • 11:00 am – 12:30 pm
    (CET)
    Berlin, Paris, Rome
  • 18:00pm – 19:30 pm
    [UTC+9]
    Seoul, Tokyo

 

 

Successful integration of semiconductor thin films in high-performance optoelectronic devices requires homogeneous electric properties across the whole film. Particularly polycrystalline layers can feature local differences in their conductivity due to morphological features such as grain boundaries or defects.

Conductive atomic force microscopy (C-AFM) is ideally suited to correlate morphology with (photo-)electric properties on polycrystalline thin films at a nanometer scale. For that, a conductive tip scans the surface in contact mode and simultaneously detects the current flow at each scan position via a sensitive current amplifier. However, lateral shear forces acting between tip and sample often cause damage during C-AFM measurements which lowers the quality of the results.

Here, we demonstrate Park systems’ PinPoint C-AFM mode enabling stable, high-resolution current imaging on optically active semiconductors. This force-spectroscopy-based approach eliminates damaging shear forces between tip and surface and thus increases reproducibility for consecutive images. Moreover, the well-defined contact force not only provides accurate and reliable C-AFM data but also offers local mechanical information like stiffness and adhesion.

Presented By : 
Alexander Klasen, Principle Scientist at Park Systems Europe, Mannheim, Germany
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Alexander received his diploma in Chemistry from the Johannes Gutenberg University Mainz and doctorate from Max-Plank-Institute for Polymer Science, where he fabricated and characterized perovskite solar cells. His expertise spans the nanoscale functioning of thin films and interface optimization of semiconducting metal oxides using AFM-based methods like C-AFM and KPFM as a main analytical tool. Prior to joining Park Systems, he was a postdoctoral research fellow of the same institute. At Park Systems, he acts as Principle Scientist to support research and industrial collaborations.

 

 

 

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