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AFM専門家によるオンラインコースを自宅で簡単に参加できます。すべてのコンテンツへ無料でアクセスできます。:ウェビナー、ライブデモ、教育用ビデオ、ソフトウェア操作方法、NanoScientificトークまで、研究に役立つ情報提供によりご使用中のAFMの可能性がさらに広がります。

近日開催予定のウェビナー
ウェビナー動画
教育用ウェビナー「AFMテクニック」
教育用ビデオ「AFMの原理」
NanoScientificトーク

ナノの世界―ナノとは?

 


近日開催予定のウェビナー

PinPointing Polymers: Nanomechanical Characterization of Functional Polymer Blends

Thursday, February 11, 2021/11:00 am (CEST)

In this webinar, we will describe and demonstrate polymer characterization using PinPointTM mapping on Park System’s NX10 atomic force microscope.

Nailing down Teflon Molecules - High Resolution AFM imaging for Polymer Science

Thursday, January 28,2021/11:00 am (CEST)

In this webinar, we will demonstrate how atomic force microscopy (AFM) can be used to acquire ultra-high-resolution images of individual PTFE-molecules on the semi-crystalline surface of commercial Teflon tape.

パーク・システムズ #5『フォース分光基礎、ナノ機械特性測定 PinPointモードについて』

2020年12月18日 金曜日

AFMは表面形状の定量測定のみならず、Force -Distanceカーブを使って探針と試料表面の機械的な相互作用力を定量的に測定することができます。

パーク・システムズ #4 原子間力顕微鏡とはー基礎コース

2020年12月4日 金曜日

毎月お届けしておりますパーク・システムズNano academy、今回のウェビナーでは、パーク・システムズ独自の真のノンコンタクト™モードとの組み合わせだからこそできる新しい電気測定技術を含めKPFM/EFMについてご紹介いたします。

PinPointing Polymers: Nanomechanical Characterization of Functional Polymer Blends

3 December, 2020

In this webinar, we will describe and demonstrate polymer characterization using PinPointTM mapping on Park System’s NX10 atomic force microscope. Additionally, we will demonstrate example measurements where electrical property maps are acquired simultaneously with topography and nanomechanical maps.

Nailing down Teflon Molecules : High Resolution AFM imaging for Polymer Science

12 November, 2020

In this webinar, we will demonstrate how atomic force microscopy (AFM) can be used to acquire ultra-high-resolution images of individual PTFE-molecules on the semi-crystalline surface of commercial Teflon tape. Both high resolution and high-speed scanning capabilities of Park Systems NX20 AFM will be demonstrated on the real-world polymer sample.

Nano: High Resolution AFM imaging for Polymer Science (Joint webinar with Nano Nature) 

10am and 5pm, 28 October, 2020

In this webinar hosted by Nano Nature, guest presenter Dr. Vladimir Korolkov (Senior Application Scientist at Park Systems UK) will demonstrate how to better understand the overall structure of polymers. You will learn to resolve individual polymer chains in real space, and witness how atomic force microscopy (AFM) can be used to acquire ultra-high-resolution images of individual PTFE-molecules on the semi-crystalline surface of commercial Teflon tape.

AFM option mode to monitor sample’s properties (with live demo)

Tuesday, 20 October, 2020

In this session, a variety of AFM option mode is introduced for investigating sample’s properties such as electrical, mechanical, magnetic, thermal and electrochemical properties. Based on Contact or Non-contact mode, AFM option mode can be combined to monitor sample’s properties as well as topography.

研究用AFM電気測定#2 EFM/KPFM - 2020年10月16日

2020年 10月 16日 金曜日 / 16:00 pm JST

今回のパーク・システムズ NanoAcademyは、研究用電気測定#2で、前回のEFM,KPFMの続きとなります。前回のお話も含めて説明させていただきますので、今回が初めてという方もどうぞご参加ください。

研究用AFM電気測定#1 EFM/KPFM - 2020年9月29日

2020年 9月 29日 火曜日 / 16:00 pm JST

毎月お届けしておりますパーク・システムズNano academy、今回のウェビナーでは、パーク・システムズ独自の真のノンコンタクト™モードとの組み合わせだからこそできる新しい電気測定技術を含めKPFM/EFMについてご紹介いたします。

How to operate AFM (with live demo)

Tuesday, 22 September, 2020 / 13:30 pm SGT

In this session, the basic principles and the application of AFM which can be used in scientific and industrial fields are examined. In particular, we share the images measured by the actual atomic force microscope with specific examples of various applications and look at their meaning. In addition, we present how to operate AFM including cantilever selection, sample preparation, description of imaging parameters and operation in order to obtain better understanding for AFM.

ウェビナー動画: How to operate AFM (with live demo)

ウェビナー動画

Nanotechnology in Plastics and Packaging

The Park Systems 2019 Materials Matter Material Science Research and AFM Webinar Series continues with Nanotechnology in Plastics and Packaging.


Surface Plasmon Resonance Spectroscopy Tandem with AFM

The Park Systems 2019 Materials Matter Material Science Research and AFM Webinar Series continues with Surface Plasmon Resonance Spectroscopy Tandem with AFM.


Viscoelastic Surfactants and Oilfield Chemicals

The Park Systems 2019 Material Science Research and AFM Webinar Series continues with Viscoelastic Surfactants and Oilfield Chemicals.



Physical Properties of Emergent 2D materials with AFM

In this webinar, the reporter will share some of the experience of using Park AFM (XE 100 and NX10). Since 2011, the reporter has used Park AFM as the main research tool, and made some interesting researches in the study of 2D material properties, the characterization of optoelectronic devices, and the exploration of novel 2D material electronic devices.


2D Nanomaterials for Smart Coatings and Fluids

2-D nanomaterials are known for its property of being only one or two atoms thick. Due to their high ratio of surface area to volume, they immensely benefit from unique physical, chemical, and biological functionality.


Emulsion Polymerization Methods and Nanomaterials

Emulsion polymerization and nanomaterials bring a hierarchy of ordering and scale. The oil/water and water/oil environments combine surfactant technologies and pickering emulsion behavior. This installment of the webinar series will review some of the examples based on janus nanoparticles and interfacial chemistry. This webinar is designed to help researchers understand leading edge developments in Materials Science Research and Applications using Atomic Force Microscopy.

Nanostructured Polymer Brushes With AFM

The Park Systems 2019 Material Science Research and AFM Webinar Series kicks off with Nanostructured Polymer Brushes With AFM, focusing on how Atomic Force Microscopy is a vital tool in characterizing the morphology of grafted polymer brushes.


教育用ウェビナー「AFMテクニック」

Investigation of Lithium Ion Battery Electrodes Using Pinpoint SSRM in Vacuum

SSRM is a scanning probe microscopy (SPM) technique that allows imaging and electrical characterization of a semiconductor materials.This webinar session will explain the basics of PinPoint SSRM and review its potential for investigating the electrical and mechanical characteristics of lithium ion battery electrodes.


PinPoint Piezoelectric Force Microscopy

PFM functions by engaging a sample surface with a sharp conductive SPM probe. This probe's tip then has an alternating current (AC) bias applied to it in order to cause a deformation of the sample surface by way of a piezoelectric force.


Electrochemical Atomic Force Microscopy (EC-AFM)

In EC-AFM, users typically perform voltamemetry and corrosion experiments using an electrochemistry cell and a choice of potentiostat or galvanostat depending on the electrochemical application of interest.


PinPoint Nanomechanical Imaging Using Probes of Various Cantilever Stiffness

PinPoint Nanomechanical mode obtains the best of resolution and accuracy for nanomechanical characterization. Stiffness, elastic modulus, adhesion force are acquired simultaneously in real-time.

Scanning Ion Conductance Microscopy (SICM) and Scanning Electrochemical Microscopy (SECM)

SICM uses the increase of access resistance in a nanopipette placed in an electrolyte solution and monitors the ionic current flowing in and out of this probe—a flow that is hindered as the tip closes in on a sample surface.



教育用ビデオ「AFMの原理」

 


NanoScientificトーク

トピック 発表者
Nanomechanics & Electrical Characterization
External Energy Assisted Nanomachining Using Soft AFM Probes Dr. Jia Deng, Binghamton University - SUNY, NSS US 2019
Atomic Force Microscopies to study Electronic Properties and Strain in Thin Films for Flexible Electronics Tobias Cramer, University of Bologna, Italy I NSFE 2018
The growth of organic ultra-thin films on silicon oxides with variable vacancy states: a Scanning Force Microscopy approach Cristiano Albonetti, CRN – ISMN, Italy I NSFE 2018
Detection of Hydrophobic Interactions on Rough Surfaces via Atomic Force Microscopy: from Measurement to Modelling Urs Peuker, TU Bergakademie Freiberg, Germany NSFE 2018
AFM Methodology
Chemical Sensitivity for Scanning Probe Microscopy Lukas Eng, Tech. University Dresden I NSFE 2018
Electrochemical measurements of single nanoparticles Kim McKelvey, Trinity College Dublin I NSFE 2019
Learning in Fundamental Atomistic Processes Using Suspended Silicon Nanowires Dr. Ye Tao, Rowland Institute at Harvard I NSS US 2018
3D Nanoscaffold Cantilevers for Potential Applications in High Speed Wafer Scale Imaging Hoa Le, The Rowland Institute at Harvard, NSS US 2019
Scanning Capacitance Spectroscopy for Dopant Analysis on Nanoscale Semiconductor Devices Phil Kaszuba, Global Foundries US I NSS US 2019
Measuring Ions and Electrons with Nanoscale Pipettes Dr. Lane Baker, Indiana University, NSS U 2019
Life Science and Biotechnology
Revisiting the Early Aggregation of Amyloids by AFM Single Molecule Statistical Analysis Francesco S. Ruggeri, University of Cambridge I NSFE 2018
Probing the Intersection of Nanotechnology and Biology Dr. Nathaniel Cady, Colleges of Nanoscale Science & Engineering I NSS US 2019
Metallo-DNA molecules as a tool for nanoscience and nanotechnology Miguel A. Galindo, CIC, University of Granada I NSFE 2019
AFM Applications in biology and medicine Malgorzata Lekka, Institute of Nuclear Physics, Poland I NSFE 2019
Organic Interfaces and Semiconductors 
Measurement Challenges arising from New Semiconductor Materials and Structures for Integrated Circuits Dr. Alain Diebold, SUNY Polytechnic Institute I NSS US 2019
Characterizing photoelectric and ferroelectric properties of materials with scanning probe microscope Akash Bhatnagar, Centre for Innovation Competence SiLi-nano I NSFE 2019
SPM Study of Tribo-Photovaltaic Effect in Metal, Semiconductor Moving Contacts Jun Liu, University at Buffalo I NSS US 2019

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