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ナノ科学シンポジウム
近日開催予定のウェビナー
ウェビナー動画
教育用ウェビナー「AFMテクニック」
教育用ビデオ「AFMの原理」

ナノ科学シンポジウム講演動画

 



近日開催予定のウェビナー

パーク・システムズ#8 研究⽤AFM: 原子間力顕微鏡とは- AFM基礎コース Part 2

2021年4月23日 金曜日

桜もそろそろ終わりですが、新年度のスタートということでAFM基礎part2をお届けいたします。
新しくAFMを始められる方、これから物性測定に挑戦される方必見です。

Accurate nanoelectronic investigations of functional materials for optoelectronics application (via PinPoint C-AFM)

Thursday, 8 April, 2021

Here, we demonstrate Park systems’ PinPoint C-AFM mode enabling stable, high-resolution current imaging on optically active semiconductors. This force-spectroscopy-based approach eliminates damaging shear forces between tip and surface and thus increases reproducibility for consecutive images. Moreover, the well-defined contact force not only provides accurate and reliable C-AFM data but also offers local mechanical information like stiffness and adhesion.

PinPointing peptides: Unveiling molecular structure and nanomechanical properties of peptide nanotubes

Thursday, 22 April, 2021

This webinar will focus on practical aspects of acquiring high resolution and nanomechanical data with both PinPointTM and True Non-ContactTM modes on a range of peptide nanotubes.

Sideband Kelvin Probe Force Microscopy for Advanced Materials Characterization

Thursday, 22 April, 2021

Sideband Kelvin Probe Force Microscopy (KPFM) uses the intermodulation of an electrostatic drive force and a mechanical drive force to upconvert the electrostatic frequency to the first flexural resonance, where the high-quality factor of the resonance yields a more sensitive measurement. The Sideband KPFM signal is calculated using a local interaction between the tip apex and the sample rather than a total interaction between the cantilever and the sample, improving the spatial resolution over other technique variations. Join us as the technical services engineer at Park Systems covers the basics and more Sideband KPFM details, including tradeoffs and imaging suggestions for Park AFM with various advanced materials images.

パーク・システムズ#7 研究⽤AFM: SmartScan Auto Mode with ライブデモ

2021年3月26日 金曜日(JST)

今回は、パーク・システムズ研究用AFMのオペレーションソフトウエアSmartScanのご紹介をライブ形式でお送りします。 AFMにご興味のある方、新しくAFMを始められる方、すでにAFMをお使いの方などの皆さま、是非ご覧ください。

パーク・システムズ#6 研究⽤AFM: C-AFM, Pinpoint C-AFM

2021年2月26日 金曜日(JST)

Park Online NanoAcademy.jp 2021年の第一弾は、「コンダクティブAFM」と「Pinpoint モードとコンダクティブAFMの組み合わせ」についてご紹介をします。

Surface Potential Imaging via Sideband KPFM

Thursday, 23 February, 2021

This webinar will introduce Sideband KPFM, using F14H20 as an object of study for the surface potential measurements.

PinPointing Polymers: Nanomechanical Characterization of Functional Polymer Blends

Thursday, February 11, 2021/11:00 am (CEST)

In this webinar, we will describe and demonstrate polymer characterization using PinPointTM mapping on Park System’s NX10 atomic force microscope.

Nailing down Teflon Molecules - High Resolution AFM imaging for Polymer Science

Thursday, January 28,2021/11:00 am (CEST)

In this webinar, we will demonstrate how atomic force microscopy (AFM) can be used to acquire ultra-high-resolution images of individual PTFE-molecules on the semi-crystalline surface of commercial Teflon tape.

パーク・システムズ #5『フォース分光基礎、ナノ機械特性測定 PinPointモードについて』

2020年12月18日 金曜日

AFMは表面形状の定量測定のみならず、Force -Distanceカーブを使って探針と試料表面の機械的な相互作用力を定量的に測定することができます。

パーク・システムズ #4 原子間力顕微鏡とはー基礎コース

2020年12月4日 金曜日

毎月お届けしておりますパーク・システムズNano academy、今回のウェビナーでは、パーク・システムズ独自の真のノンコンタクト™モードとの組み合わせだからこそできる新しい電気測定技術を含めKPFM/EFMについてご紹介いたします。

ウェビナー動画

Nanotechnology in Plastics and Packaging

The Park Systems 2019 Materials Matter Material Science Research and AFM Webinar Series continues with Nanotechnology in Plastics and Packaging.


Surface Plasmon Resonance Spectroscopy Tandem with AFM

The Park Systems 2019 Materials Matter Material Science Research and AFM Webinar Series continues with Surface Plasmon Resonance Spectroscopy Tandem with AFM.


Viscoelastic Surfactants and Oilfield Chemicals

The Park Systems 2019 Material Science Research and AFM Webinar Series continues with Viscoelastic Surfactants and Oilfield Chemicals.



Physical Properties of Emergent 2D materials with AFM

In this webinar, the reporter will share some of the experience of using Park AFM (XE 100 and NX10). Since 2011, the reporter has used Park AFM as the main research tool, and made some interesting researches in the study of 2D material properties, the characterization of optoelectronic devices, and the exploration of novel 2D material electronic devices.


2D Nanomaterials for Smart Coatings and Fluids

2-D nanomaterials are known for its property of being only one or two atoms thick. Due to their high ratio of surface area to volume, they immensely benefit from unique physical, chemical, and biological functionality.


Emulsion Polymerization Methods and Nanomaterials

Emulsion polymerization and nanomaterials bring a hierarchy of ordering and scale. The oil/water and water/oil environments combine surfactant technologies and pickering emulsion behavior. This installment of the webinar series will review some of the examples based on janus nanoparticles and interfacial chemistry. This webinar is designed to help researchers understand leading edge developments in Materials Science Research and Applications using Atomic Force Microscopy.

Nanostructured Polymer Brushes With AFM

The Park Systems 2019 Material Science Research and AFM Webinar Series kicks off with Nanostructured Polymer Brushes With AFM, focusing on how Atomic Force Microscopy is a vital tool in characterizing the morphology of grafted polymer brushes.


教育用ウェビナー「AFMテクニック」

Investigation of Lithium Ion Battery Electrodes Using Pinpoint SSRM in Vacuum

SSRM is a scanning probe microscopy (SPM) technique that allows imaging and electrical characterization of a semiconductor materials.This webinar session will explain the basics of PinPoint SSRM and review its potential for investigating the electrical and mechanical characteristics of lithium ion battery electrodes.


PinPoint Piezoelectric Force Microscopy

PFM functions by engaging a sample surface with a sharp conductive SPM probe. This probe's tip then has an alternating current (AC) bias applied to it in order to cause a deformation of the sample surface by way of a piezoelectric force.


Electrochemical Atomic Force Microscopy (EC-AFM)

In EC-AFM, users typically perform voltamemetry and corrosion experiments using an electrochemistry cell and a choice of potentiostat or galvanostat depending on the electrochemical application of interest.


PinPoint Nanomechanical Imaging Using Probes of Various Cantilever Stiffness

PinPoint Nanomechanical mode obtains the best of resolution and accuracy for nanomechanical characterization. Stiffness, elastic modulus, adhesion force are acquired simultaneously in real-time.

Scanning Ion Conductance Microscopy (SICM) and Scanning Electrochemical Microscopy (SECM)

SICM uses the increase of access resistance in a nanopipette placed in an electrolyte solution and monitors the ionic current flowing in and out of this probe—a flow that is hindered as the tip closes in on a sample surface.



教育用ビデオ「AFMの原理」

 

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