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Probe Store - EFM/DC-EFM/SKPM

* We do not guarantee the performance of probes ordered directly from the manufacturer; for optimal performance with our AFM systems please request a quote from Park Systems.

Probe Force Constant (N/m) Frequency (kHz ) Manufacture Short Description Quote
NSC14/CR-AU 5 160 Mikromasch ▪ Cantilever with lower force constant for EFM
▪ Conductive tip for electrical application, Coated with Cr-Au 		Request Quote
Cantilever Resonance Frequency, kHz Force Constant, N/m Length
l ± 5,
µm		 Width
w ± 3,
µm		 Thickness
t ± 0.5,
µm
min typ max min typ max
14 Series 110 160 220 1.8 5 13 125 25 2.1
PPP-NCSTAu 7.4 160 Nanosensors ▪ Cantilever with lower force constant
▪ Conductive tip for electric application, Coated with Au 		Request Quote

NANOSENSORS™ PPP-NCSTAu AFM probes are designed for non-contact or soft tapping mode imaging. The combination of soft cantilever and fairly high resonance frequency enables stable and fast measurements with reduced tip-sample interaction. This feature significantly reduces tip wear and sample wear at the same time.

Property Nominal Value Specified Range
Thickness /µm 2.8 1.8 - 3.8
Mean Width /µm 27 19.5 - 34.5
Length /µm 150 140 - 160
Force Constant /(N/m) 7.4 1.2 - 29
Resonance Frequency /kHz 160 75 - 265
PPP-EFM 2.8 75 Nanosensors ▪ Cantilever with lower force constant
▪ Conductive tip for electric application, Coated with Pt-Ir 		Request Quote

The PPP-EFM probe is offered for electrostatic force microscopy. An overall metallic coating (PtIr5) on both sides of the cantilever increasing the electrical conductivity of the tip. The force constant of this type is specially tailored for the electrostatic force microscopy yielding very high force sensitivity while simultaneously enabling tapping mode and lift mode operation.

Property Nominal Value Specified Range
Thickness /µm 3 2.0 - 4.0
Mean Width /µm 28 20 - 35
Length /µm 225 215 - 235
Force Constant /(N/m) 2.8 0.5 - 9.5
Resonance Frequency /kHz 75 45 - 115
CDT-CONTR 0.2 13 Nanosensors ▪ Contact cantilever for DC-EFM, Backside reflex coating
▪ Electrically conductive diamond-coated tip 		Request Quote

NANOSENSORS™ CDT-CONTR probes are designed for contact mode (repulsive mode) SPM imaging. For applications that require a wear resistant and an electrically conductive tip we recommend this type. Some applications are Tunneling AFM and Scanning Capacitance Microscopy (SCM). The CDT Diamond Coating is highly doped and the total resistance measured in contact to a platinium surface is < 10 kOhm.

Property Nominal Value Specified Range
Thickness /µm 2 1.0 - 3.0
Mean Width /µm 50 42.5 - 57.5
Length /µm 450 440 - 460
Force Constant /(N/m) 0.5 0.1 - 1.7
Resonance Frequency /kHz 20 11 - 29
CDT-NCHR 42 330 Nanosensors ▪ Cantilever with high resonant frequency for DC-EFM, Backside reflex coating
▪ Electrically conductive diamond-coated tip 		Request Quote

NANOSENSORS™ CDT-NCHR probes are designed for non-contact mode or tapping mode AFM (also known as: attractive or dynamic mode). This sensor type combines high operation stability with outstanding sensitivity and fast scanning ability. For applications that require a wear resistant and an electrically conductive tip we recommend this type. Some applications are Tunneling AFM and Scanning Capacitance Microscopy (SCM). The CDT Diamond Coating is highly doped and the total resistance measured in contact to a platinium surface is < 10 kOhm.

Property Nominal Value Specified Range
Thickness /µm 4 3.0 - 5.0
Mean Width /µm 30 22.5 - 37.5
Length /µm 125 115 - 135
Force Constant /(N/m) 80 23 - 225
Resonance Frequency /kHz 400 225 - 610
NSC36/CR-AU 0.95 
1.75 
0.6 		105 
155 
75 		 Mikromasch ▪ Contact cantilever for EFM, 3 cantilevers on a chip
▪ Conductive tip for electrical application, Coated with Cr-Au 		 Request Quote
NSC36,
Cantilevers		 Resonance Frequency, kHz Force Constant, N/m Length
l ± 5,
µm		 Width
w ± 3,
µm		 Thickness
t ± 0.5,
µm
min typ max min typ max
A 30 90 160 0.1 1 4.6 110 32.5 1.0
B 45 130 240 0.2 2 9 90 32.5 1.0
C 25 65 115 0.06 0.6 2.7 130 32.5 1.0
Multi75E 3 75  Budget Sensors ▪ Cantilever with lower force constant
▪ Conductive tip for electric application, Coated with Cr-Pt 		Request Quote

Rotated Monolithic silicon probe
Symmetric tip shape
Chipsize 3.4 x 1.6 x 0.3 mm

  value range
Resonant Frequency 75 kHz ± 15 kHz
Force Constant 3 N/m 1 N/m to 7 N/m
Length 225 µm ± 10 µm
Mean Width 28 µm ± 5 µm
Thickness 3 µm ± 1 µm
Tip Height 17 µm ± 2 µm
Tip Set back 15 µm ± 5 µm
Tip Radius < 25 nm
Coating Conductive Cr/Pt on both sides
Half Cone Angle 20°-25° along cantilever axis
25°-30° from side
10° at the apex
Contact Resistance 300 Ohms on platinum thin film surface
Platinum 18 14  - ▪ Contact cantilever made of solid platinum
▪ Recommended for high voltage/current application above ±10 V or 1 µA 		Request Quote

The solid platinum probe, whose tip radius is smaller than 20nm, shows better performance than a typical metal-coated probes.

Technical Data Nominal Value Specified Range
Width (µm) 100 90 - 110
Length(µm) 300 250 – 350
Force Constant(N/m) 18 10.8 -25.2
Resonance Frequency (kHz) 14 9.8 – 18.2
 

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