Probe Store - EFM/DC-EFM/SKPM
* We do not guarantee the performance of probes ordered directly from the manufacturer; for optimal performance with our AFM systems please request a quote from Park Systems.
Probe | Force Constant (N/m) | Frequency (kHz ) | Manufacture | Short Description | Quote | ||||||||||||||||||||||||||||||||||||||||||||||
NSC14/CR-AU | 5 | 160 | Mikromasch | ▪ Cantilever with lower force constant for EFM ▪ Conductive tip for electrical application, Coated with Cr-Au |
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PPP-NCSTAu | 7.4 | 160 | Nanosensors | ▪ Cantilever with lower force constant ▪ Conductive tip for electric application, Coated with Au |
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NANOSENSORS™ PPP-NCSTAu AFM probes are designed for non-contact or soft tapping mode imaging. The combination of soft cantilever and fairly high resonance frequency enables stable and fast measurements with reduced tip-sample interaction. This feature significantly reduces tip wear and sample wear at the same time.
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PPP-EFM | 2.8 | 75 | Nanosensors | ▪ Cantilever with lower force constant ▪ Conductive tip for electric application, Coated with Pt-Ir |
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The PPP-EFM probe is offered for electrostatic force microscopy. An overall metallic coating (PtIr5) on both sides of the cantilever increasing the electrical conductivity of the tip. The force constant of this type is specially tailored for the electrostatic force microscopy yielding very high force sensitivity while simultaneously enabling tapping mode and lift mode operation.
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CDT-CONTR | 0.2 | 13 | Nanosensors | ▪ Contact cantilever for DC-EFM, Backside reflex coating ▪ Electrically conductive diamond-coated tip |
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NANOSENSORS™ CDT-CONTR probes are designed for contact mode (repulsive mode) SPM imaging. For applications that require a wear resistant and an electrically conductive tip we recommend this type. Some applications are Tunneling AFM and Scanning Capacitance Microscopy (SCM). The CDT Diamond Coating is highly doped and the total resistance measured in contact to a platinium surface is < 10 kOhm.
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CDT-NCHR | 42 | 330 | Nanosensors | ▪ Cantilever with high resonant frequency for DC-EFM, Backside reflex coating ▪ Electrically conductive diamond-coated tip |
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NANOSENSORS™ CDT-NCHR probes are designed for non-contact mode or tapping mode AFM (also known as: attractive or dynamic mode). This sensor type combines high operation stability with outstanding sensitivity and fast scanning ability. For applications that require a wear resistant and an electrically conductive tip we recommend this type. Some applications are Tunneling AFM and Scanning Capacitance Microscopy (SCM). The CDT Diamond Coating is highly doped and the total resistance measured in contact to a platinium surface is < 10 kOhm.
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NSC36/CR-AU | 0.95 1.75 0.6 |
105 155 75 |
Mikromasch | ▪ Contact cantilever for EFM, 3 cantilevers on a chip ▪ Conductive tip for electrical application, Coated with Cr-Au |
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Multi75E | 3 | 75 | Budget Sensors | ▪ Cantilever with lower force constant ▪ Conductive tip for electric application, Coated with Cr-Pt |
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Rotated Monolithic silicon probe
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Platinum | 18 | 14 | - | ▪ Contact cantilever made of solid platinum ▪ Recommended for high voltage/current application above ±10 V or 1 µA |
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The solid platinum probe, whose tip radius is smaller than 20nm, shows better performance than a typical metal-coated probes.
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