Dynamic Contact EFM (EFM-DC)
High Resolution and High Sensitivity Imaging of Electrostatic Force
EFM-DC is capable of extremely high definition EFM results. Patented by Park Systems*, EFM-DC actively applies an AC voltage bias to the cantilever and detects the amplitude and the phase change of the cantilever modulation with respect to the applied bias. EFM-DC provides the ability to monitor the second harmonic of the modulation which can be compared to the capacitance of a sample and enhances the electric force signal from the background intermolecular force.
