Piezoelectric Force Microscopy (PFM)
Our patented PFM mode accurately measures electric domain structures such as polarity in ferroelectric or piezoelectric samples. This mode includes independent control of an applied AC and DC bias, and local amplitude/phase vs. DC bias spectroscopy.
Specifications :
AC bias frequency: 0 - 100 kHz
Phase resolution: 0.005°
DC Bias: - 10 - +10 V (-2kv - +2kV, optional)
*US Patent No : 6185991
[Topography] / [EFM amplitude] / [EFM phase]
Domain switching , appllied +20V to outer square and -20V to inner square.
Ferroelectric Polymer on ITO
Scan size: 10 µm
Using Probe: Contsc Pt
Imaged on a Park XE-Series using DC-EFM Mode.
