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  • Park AFM
    ナノメカニカルモード
    メカニカルスキャンモードを用いることで、サンプルの機械的特性を簡単に測定できます。
    各機能がParkのトレードマークである正確さを備えているため、信頼できるデータを収集可能です。

Force Modulation Microscopy (FMM)

Force Amplitude and Phase Imaging of Sample Elasticity

Our FMM mode measures mechanical property variations over a sample’s surface. An AC modulation is applied to the cantilever while in contact with the sample surface, allowing you to monitor changes in amplitude and phase and gain insights into qualitative elastic and viscous responses.

Force-Modulation-Microscopy

The amplitude of cantilever deflection varies according to the mechanical properties of the sample surface.

 
crystal-facetts

[Topography] [FMM Phase]

Crystal Facetts
Scan size: 10µm
Using Probe: NSC36C
Imaged on a Park XE series using FMM.
 

Nanomechanical Modes