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  • Park AFM
    Nanomechanical Modes
    Easily measure the mechanical properties of your sample using our set of mechanical scanning modes.
    Each features Park System’s trademark accuracy so you always know
    you’re collecting data you can rely on.

Lateral Force Microscopy (LFM)

Lateral Force Microscopy (LFM)

Mapping of the Frictional Force

Park AFMs are not only capable of detecting cantilever deflections in the vertical direction, but also the lateral, producing a lateral force microscopy image.

Lateral-Force-Microscopy-LFM

Lateral deflection signals of the cantilever.

 
lfm-polymer

[Topography] / [LFM Image (Left to Right)] / [LFM Image (Right to Left)]

Polymer on Silicon
Scan size: 2µm
Using Probe: NSC36C
Imaged on a Park XE-Series using LFM Mode.
 

Nanomechanical Modes

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