Lateral Force Microscopy (LFM)

Mapping of the Frictional Force

Park AFMs are not only capable of detecting cantilever deflections in the vertical direction, but also the lateral, producing a lateral force microscopy image.

Lateral deflection signals of the cantilever.

[Topography] / [LFM Image (Left to Right)] / [LFM Image (Right to Left)]

Polymer on Silicon
Scan size: 2µm
Using Probe: NSC36C
Imaged on a Park XE-Series using LFM Mode.

Lateral Force Microscopy (LFM)

Mapping of the Frictional Force

Specifications :

Nanomechanical Modes

研究用			生産ライン用