Microscopic Mapping: Post Application Treated Silanefilm
Material
Si/SiO2-substrate with an applied layer of (3-Glycidyloxypropyl)- trimethoxysilane (GLYMO)
3-Glycidyloxypropyl)-trimethoxysilane (GLYMO)
Experimental
Delta and Psi-Maps were recorded with an spectroscopic imaging ellipsometer nanofilm_ep4 at a wavelength of 400 nm. The system was equipped with a 10x objective and the focus scanner was used
Results
Microscopic Delta map of post application treated silane films.
Reference
Peter H. Thiesen, Philipp Jähde (2018) Compendium, Characterizing Silanized Surfaces with Imaging Ellipsome
https://www.researchgate.net/publication/326740970_Characterizing_Silanized_Surfaces_with_Imaging_Ellipsometry
